Traceable metrology of soft-X-ray to IR optical constants and nanofilms for advanced manufacturing

    Project Details

    AcronymATMOC (EMPIR)
    StatusFinished
    Effective start/end date01/07/202130/06/2024

    Fingerprint

    Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.