Young Scientist Award (GADEST)

Pasanen, Toni (Recipient), Savin, Hele (Supervising professor) & Vähänissi, Ville (Advisor)

Prize: Award or honor granted for a specific work

Awarded date	27 Sept 2019
Degree of recognition	International

Awarded at event

Event title	Conference on Gettering and Defect Engineering in Semiconductor Technology
Location	Seehotel Zeuthen, Zeuthen, GermanyShow on map
Period	22 Sept 2019 → 27 Sept 2019

Publications and artistic outputs
(oral talk) Passivation of Detector‐Grade FZ‐Si with ALD‐Grown Aluminium Oxide
Research output: Contribution to conference › Abstract › Scientific › peer-review