Jonatan Slotte

Jonatan Slotte

    • Puumiehenkuja 2, 02150 Espoo

    19992022

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    • 2014

      Defect studies in MBE grown GaSb1-xBix layers

      Segercrantz, N., Kujala, J., Tuomisto, F., Slotte, J., Song, Y. & Wang, S., 2014, INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013. Cavallini, A. & Estreicher, SK. (eds.). American Institute of Physics, p. 174-177 4 p. (AIP Conference Proceedings ; vol. 1583).

      Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    • Positron annihilation spectroscopy on open-volume defects in group IV semiconductors

      Slotte, J., Tuomisto, F., Kujala, J., Holm, A. M., Segercrantz, N., Kilpeläinen, S., Kuitunen, K., Simoen, E., Gencarelli, F., Loo, R. & Shimura, Y., 2014, ECS Transactions. 11 ed. Electrochemical Society, Vol. 64. p. 241-253 13 p.

      Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

      2 Citations (Scopus)
    • 2007

      Defect Generation and Evolution in Laser Processing of Si

      La Magna, A., Privitera, V., Mannino, G., Fortunato, G., Cuscuna, M., Svensson, B. G., Monakhov, E., Kuitunen, K., Slotte, J. & Tuomisto, F., 2007, Proceedings of the 15th International Conference on Advanced Thermal Processing of Semiconductors (IEEE). p. 245-250

      Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

      2 Citations (Scopus)
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