Research output per year
Research output per year
- 200 - 214 out of 214 results
Search results
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2002
Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy: CaF2 (111) as a reference surface
Foster, A. S., Barth, C., Shluger, A. L., Nieminen, R. M. & Reichling, M., 2002, In: Physical Review B (Condensed Matter and Materials Physics). 66, 23, p. 1-10 10 p., 235417.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile159 Downloads (Pure) -
Vacancy and interstitial defects in hafnia
Foster, A. S., Lopez Gejo, F., Shluger, A. L. & Nieminen, R. M., 2002, In: Physical Review B. 65, 17, p. 1-13 13 p., 174117.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile617 Citations (Scopus)185 Downloads (Pure) -
2001
Contrast Formation in Atomic Resolution Scanning Force Microscopy on CaF2 (111): Experiment and Theory
Barth, C., Foster, A. S., Reichling, M. & Shluger, A. L., 2001, In: Journal of physics: Condensed matter. 13, 10, p. 2061–2079 19 p.Research output: Contribution to journal › Article › Scientific › peer-review
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Imaging problems on insulators: What can be learnt from NC-AFM modelling on CaF2?
Foster, A. S., Rohl, A. L. & Shluger, A. L., 2001, In: APPLIED PHYSICS A-MATERIALS SCIENCE AND PROCESSING. 72, Suppl. 1, p. S31-S34 4 p.Research output: Contribution to journal › Article › Scientific › peer-review
7 Citations (Scopus) -
Quantitative modelling in scanning probe microscopy
Foster, A. S., Hofer, W. A. & Shluger, A. L., 2001, In: Current Opinion in Solid State and Materials Science. 5, 5, p. 427-434 8 p.Research output: Contribution to journal › Review Article › peer-review
12 Citations (Scopus) -
Spin-contrast in non-contact SFM on oxide surfaces: Theoretical modelling of NiO(001) surface
Foster, A. S. & Shluger, A. L., 1 Sept 2001, In: Surface Science. 490, 1-2, p. 211-219 9 p.Research output: Contribution to journal › Article › Scientific › peer-review
28 Citations (Scopus) -
Structure and electrical levels of point defects in monoclinic zirconia
Foster, A. S., Sulimov, V. B., Lopez Gejo, F., Shluger, A. L. & Nieminen, R. M., 2001, In: Physical Review B. 64, 22, p. 1-10 10 p., 224108.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile339 Citations (Scopus)72 Downloads (Pure) -
Tip and surface properties from the distance dependence of tip-surface interactions
Foster, A. S., Kantorovich, L. N. & Shluger, A. L., 2001, In: APPLIED PHYSICS A-MATERIALS SCIENCE AND PROCESSING. 72, Suppl. 1, p. S59–S62 4 p.Research output: Contribution to journal › Article › Scientific › peer-review
10 Citations (Scopus) -
Unambiguous interpretation of atomically resolved force microscopy images of an insulator
Foster, A. S., Barth, C., Shluger, A. L. & Reichling, M., 2001, In: Physical Review Letters. 86, 11, p. 2373-2376 4 p.Research output: Contribution to journal › Article › Scientific › peer-review
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2000
Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory
Bennewitz, R., Foster, A. S., Kantorovich, L. N., Bammerlin, M., Loppacher, C., Schär, S., Guggisberg, M., Meyer, E. & Shluger, A. L., 2000, In: Physical Review B (Condensed Matter and Materials Physics). 62, 3, p. 2074-2084 11 p.Research output: Contribution to journal › Article › Scientific › peer-review
190 Citations (Scopus) -
Role of image forces in non-contact scanning force microscope images of ionic surfaces
Kantorovich, L. N., Foster, A. S., Shluger, A. L. & Stoneham, A. M., 20 Jan 2000, In: Surface Science. 445, 2-3, p. 283-299 17 p.Research output: Contribution to journal › Article › Scientific › peer-review
48 Citations (Scopus) -
1999
Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)
Sushko, P. V., Foster, A. S., Kantorovich, L. N. & Shluger, A. L., Apr 1999, In: Applied Surface Science. 144-145, p. 608-612 5 p.Research output: Contribution to journal › Article › Scientific › peer-review
23 Citations (Scopus) -
Model of noncontact scanning force microscopy on ionic surfaces
Livshits, A. I., Shluger, A. L., Rohl, A. L. & Foster, A. S., 1999, In: Physical Review B (Condensed Matter and Materials Physics). 59, 3, p. 2436-2448 13 p.Research output: Contribution to journal › Article › Scientific › peer-review
129 Citations (Scopus) -
Models of image contrast in scanning force microscopy on insulators
Shluger, A. L., Livshits, A. I., Foster, A. S. & Catlow, C. R. A., 1999, In: Journal of physics: Condensed matter. 11, 26, p. R295-R322 28 p.Research output: Contribution to journal › Review Article › peer-review
26 Citations (Scopus)