Projects per year
Collaborations and top research areas from the last five years
Profiles
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Robin Aschan
- Department of Electrical Engineering and Automation - Visitor (Faculty)
- Metrology Research Institute - Visitor (Faculty)
Person: Visiting Scholar
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Afsaneh Eghbali Yeldagermani
- Department of Electrical Engineering and Automation - Doctoral Researcher
- School of Electrical Engineering
- Metrology Research Institute - Doctoral Researcher
Person: Doctoral students, Doctoral Student
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Projects
- 3 Finished
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Universal electromagnetic radiation detector
Ikonen, E. (Principal investigator), Sharma, S. (Project Member), Karhu, J. (Project Member), Manoocheri, F. (Project Member), Lanevski, D. (Project Member) & Laurila, T. (Project Member)
01/01/2018 → 31/12/2021
Project: Academy of Finland: Other research funding
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EMRP ENV09 SolarUV - Traceability for surface spectral solar ultraviolet radiation
Kärhä, P. (Principal investigator) & Pulli, T. (Project Member)
01/08/2011 → 31/07/2014
Project: EU: Other research funding
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Effects of UV-radiation on materials
Kärhä, P. (Principal investigator)
01/05/2005 → 30/04/2007
Project: Business Finland: Other research funding
Research output
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Application of a bandwidth correction method to thin-film reflectance measurements
Danilenko, A., Rastgou, M., Manoocheri, F. & Ikonen, E., 1 Feb 2026, In: Metrologia. 63, 1, p. 1-7 7 p., 015007.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile1 Citation (Web of Science)4 Downloads (Pure) -
Characterisation of Complex Multilayer Nanostructures with High Aspect Ratio
Ikonen, E., Danilenko, A., Rastgou, M., Manoocheri, F., Kinnunen, J., Korpelainen, V. & Lassila, A., 7 Apr 2026, In: Physica Status Solidi (A) Applications and Materials Science. 223, 7, 7 p., e202501022.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile4 Downloads (Pure) -
Comparison of thin-film thickness measurements using ellipsometry and reflectometry with uniform samples
Rastgou, M., Hulagu, D., Danilenko, A., Manoocheri, F., Hertwig, A. & Ikonen, E., 1 Feb 2026, In: Metrologia. 63, 1, p. 1-14 14 p., 015006.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile7 Downloads (Pure)
Datasets
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Hardware Benchmark for Deep Learning Capability
Vo, H. Q. N. (Creator), Zenodo, 7 Jun 2021
DOI: 10.5281/zenodo.4905213, https://zenodo.org/record/4905213
Dataset: Software or code
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Spectral mismatch uncertainty estimation in solar cell calibration using Monte Carlo simulation
Maham, K. (Creator), Zenodo, 29 Mar 2021
DOI: 10.5281/zenodo.4643969, https://zenodo.org/record/4643970 and one more link, http://dx.doi.org/10.21227/nq71-m628 (show fewer)
Dataset
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Long-term spectral responsivity stability of predictable quantum efficient detectors
Porrovecchio, G. (Creator), Ulrike, L. (Contributor), Smid, M. (Contributor), Gran, J. (Contributor), Ikonen, E. (Contributor) & Werner, L. (Contributor), Mendeley Data, 18 Jan 2023
DOI: 10.17632/xgz656n9dx.1, https://data.mendeley.com/datasets/xgz656n9dx
Dataset
Activities
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Uncertainty of evaluation of spectral mismatch correction factor
Rezazadeh, Y. (Speaker)
Sept 2023Activity: Talk or presentation types › Conference presentation
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Optical power scale realization using the predictable quantum efficient detector
Maham, K. (Speaker)
2021Activity: Talk or presentation types › Conference presentation
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METHODOLOGIES TO MEASURE SPATIAL UNIFORMITIES OF INTEGRATING SPHERES
Maham, K. (Speaker)
Sept 2021 → …Activity: Talk or presentation types › Conference presentation
Press/Media
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Studies Conducted at Aalto University on Photovoltaics Recently Reported (Spectral Mismatch Uncertainty Estimation In Solar Cell Calibration Using Monte Carlo Simulation)
08/11/2023
1 item of Media coverage
Press/Media: Media appearance
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The President has appointed two new Principal university lecturers
07/06/2023
1 item of Media coverage
Press/Media: Media appearance
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Technical report: LEDs change laboratory measurements of light
17/02/2023 → 18/02/2023
3 items of Media coverage
Press/Media: Media appearance