Journal of X-Ray Science and Technology

X-ray excited optical luminescence of Mg-doped GaN

Lankinen, A., Svensk, O., Mattila, M., Tuomi, T., Lipsanen, H., McNally, P., "O'reilly", L. & Paulmann, C., 2008, In : Journal of X-Ray Science and Technology. 16, 3, p. 215-220 6 p.

Research output: Contribution to journal › Article

Total reflection X-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure

McNally, P. J., Dilliway, G., Bonar, J. M., Willoughby, A., Tuomi, T., Rantamäki, R., Danilewsky, A. N. & Lowney, D., 2002, In : Journal of X-Ray Science and Technology. 9, p. 121-130

Research output: Contribution to journal › Article

Comparative analysis of synchrotron X-ray transmission and reflection topography techniques applied to epitaxial laterally overgrown GaAs layers

Rantamäki, R., Tuomi, T., Zytkiewicz, Z. R., McNally, P. J. & Danilewsky, A. N., 2000, In : Journal of X-Ray Science and Technology. 8, 4, p. 277-288

Research output: Contribution to journal › Article