Journal of X-Ray Science and Technology
Research outputs
1 - 3 out of 3Page size: 50
- 2008
- Published
X-ray excited optical luminescence of Mg-doped GaN
Lankinen, A., Svensk, O., Mattila, M., Tuomi, T., Lipsanen, H., McNally, P., "O'reilly", L. & Paulmann, C., 2008, In : Journal of X-Ray Science and Technology. 16, 3, p. 215-220 6 p.Research output: Contribution to journal › Article › Scientific › peer-review
- 2002
- Published
Total reflection X-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure
McNally, P. J., Dilliway, G., Bonar, J. M., Willoughby, A., Tuomi, T., Rantamäki, R., Danilewsky, A. N. & Lowney, D., 2002, In : Journal of X-Ray Science and Technology. 9, p. 121-130Research output: Contribution to journal › Article › Scientific › peer-review
- 2000
- Published
Comparative analysis of synchrotron X-ray transmission and reflection topography techniques applied to epitaxial laterally overgrown GaAs layers
Rantamäki, R., Tuomi, T., Zytkiewicz, Z. R., McNally, P. J. & Danilewsky, A. N., 2000, In : Journal of X-Ray Science and Technology. 8, 4, p. 277-288Research output: Contribution to journal › Article › Scientific › peer-review
ID: 323318
