JOURNAL OF NANO RESEARCH

Research outputs

  1. 2010
  2. Published

    Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry

    Rangel-Kuoppa, V. T., Sopanen, M. & Lipsanen, H., Dec 2010, In : JOURNAL OF NANO RESEARCH. 12, p. 45-54 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

ID: 309156