Intellectual Property India Publishes Patent Application for 'An Assessment System and Method for Determining at Least one of Macrotopology Milli Topology Micro Topology and Nano Topology' Filed by University of Oulu

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References

TitleIntellectual Property India Publishes Patent Application for 'An Assessment System and Method for Determining at Least one of Macrotopology Milli Topology Micro Topology and Nano Topology' Filed by University of Oulu
Media name/outletIPR
CountryIndia
Date06/09/2018
PersonsHeikki Nieminen, Seppo Saarakkala
Period6 Sep 2018

ID: 35228033