Record-high UV response in implanted junctions through passivation of surface defects and minimisation of boron implantation damage
- Kexun Chen (Speaker)
- Setälä, O. (Contributor)
- Radfar, B. (Contributor)
- Udo Kroth (Contributor)
- Vähänissi, V. (Contributor)
- Savin, H. (Contributor)
Activity: Talk or presentation types › Conference presentation