Proof of concept: ARC-free black interdigitated back contact module with wide acceptance angle

Pablo Ortega (Contributor)
Toni Pasanen (Speaker)
Moises Garin (Contributor)
Guillaume von Gastrow (Contributor)
Tuukka Savisalo (Contributor)
Antti Tolvanen (Contributor)
Henri Vahlman (Contributor)
Vähänissi, V. (Contributor)
David Carrio (Contributor)
Ramon Alcubilla (Contributor)
Savin, H. (Contributor)

Activity: Talk or presentation types › Conference presentation

Period	6 Feb 2020
Event title	SPIE Photonics West
Event type	Conference
Location	San Francisco, United States, CaliforniaShow on map
Degree of Recognition	International

Related content

Infrastructure
OtaNano - Nanofab
Facility/equipment: Facility

Publications and artistic outputs
Black silicon back contact module with wide light acceptance angle
Research output: Contribution to journal › Article › Scientific › peer-review
(oral talk) Black silicon back contact module with wide light acceptance angle
Research output: Contribution to conference › Abstract › Scientific › peer-review

Projects
Black silicon and defect engineering for highly efficient solar cells and modules, BLACK
Project: Business Finland: Other research funding