| Period | 23 Sept 2019 |
|---|---|
| Event title | Conference on Gettering and Defect Engineering in Semiconductor Technology |
| Event type | Conference |
| Conference number | 18 |
| Location | Zeuthen, GermanyShow on map |
| Degree of Recognition | International |
Related content
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Research output
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Passivation of Detector‐Grade FZ‐Si with ALD‐Grown Aluminium Oxide
Research output: Contribution to journal › Article › Scientific › peer-review
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(oral talk) Passivation of Detector‐Grade FZ‐Si with ALD‐Grown Aluminium Oxide
Research output: Contribution to conference › Abstract › Scientific › peer-review
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Infrastructure
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OtaNano - Nanofab
Facility/equipment: Facility
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Prizes
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Young Scientist Award (GADEST)
Prize: Award or honor granted for a specific work