International Conference on Defects in Semiconductors

Tuomisto, F. (Member)

Activity: Participating in or organising an event typesMembership of an organizing committee or other positions of trust of a conference or a seminar

Description

International Conference on Defects in Semiconductors (biennal series), Member of the International Advisory Committee 2009-
Period20092017
Event typeConference
Degree of RecognitionInternational