High-speed error counting in silicon quantum dot charge pumps

Jenei, M. (Speaker)

Activity: Talk or presentation typesConference presentation

Description

Single-charge pumps have demonstrated to produce a highly accurate quantized current of 160 pA with a relative uncertainty below 0.27 ppm, specifically for applications in quantum metrology[1]. The reported uncertainty mostly dominated by the experimental apparatus, resulting inconveniently long averaging times. To overcome this and systematic errors, in-situ charge sensing is a promising solution. We present our most recent progress on a novel twin aluminium single-electron-transistor charge sensor capacitively coupled to a silicon quantum dot pump. The sensor constitutes an improvement in the detection sensitivity that was the limiting factor of our first generation of designs [2]. The new hybrid device potentially allows us to carry out error counting by combining bidirectional pumping and charge sensing.
Period13 Mar 2018
Event titleDPG-Frühjahrstagung : der Sektion Kondensierte Materie gemeinsam mit der EPS
Event typeConference
LocationBerlin, Germany
Degree of RecognitionInternational