Gordon Research Conference on Defects in Semiconductors

Tuomisto, F. (Member)

Activity: Participating in or organising an event typesMembership of a scientific or program committee of a conference or seminar

Description

Gordon Research Conference on Defects in Semiconductors, New London, NH, USA (biennial meeting), member of the programme committee 2008, 2010, 2012, 2014, 2016.
Period20082016
Event typeConference
Location
Degree of RecognitionInternational